Scanning electron microscopy (SEM): Wavelentgth dispersive X- ray spectroscopy and cathodoluminescence (CL)

Benefit description

-The Scanning electron microscope is an instrument that allows the observation and characterization of inorganic and organic materials by studying surfaces. From the electron beam incident on the sample different signal types are generated from the sample (secondary electrons, backscattered X-rays, etc) are used to examine many characteristics (topography, density of the different components). -the Analyzer by Cathodoluminescence (CL) is a nondestructive analysis technique making a spectral analysis of the sample having luminescence and emits electrons when bombarded by providing analytical and sample structural information. Detectors cathodoluminescence MonoCL3 MNCN in combination with SEM Inspect in which it is installed has a great response capacity and very good quantum efficiency, allowing you to obtain spectra even in samples with very low, such as hydroxyapatites, coal, wood releases , kidney stones, whose CL spectra are poorly studied worldwide. It is a complementary technique to RAMAN as the samples that have luminescence and can not be seen by Raman spectroscopy can be analyzed with the detector Cathodoluminescence and be able to analyze the molecular structure in the visible and infrared range lighting.It also allows analysis of Cl at different temperatures, even at -196 .