XRD (X-Ray Diffraction) of thin films

Service description

Siemens D-5000 (Equipo A): This equipment is a conventional powder diffraction with a standard Cu x-ray source. The D5000 is used for the majority of routine characterisation work. Common type of measurements are conventional x-ray diffraction, reflectometry studies, grazing incidence diffraction and out-of-plane diffraction on thin films Bruker D8 Advance (Equipo B): This versatile instrument comes with 2D detector types for measuring data to high accuracy and at high speed. Common type of measurement are texture measurement with bidimensional detector on thin films, determination of orientation distribution of crystallites in the sample in magnetic and superconductor materials, evaluation of a chemistry reactions and strain measurements of epitaxial thin films. Has also been acquired residual stress measurement of polycrystalline samples, when used for stress measurement. A great feature associated with the 2D system is the the microdiffraction, this technical covers many diffraction analysis involving small samples or small area or small volume of large area. Other measurements acquired with the same equipment are the diffraction of liquid samples with nanoparticles in capillary. D8 Discover (Equipo C): The D8 DISCOVER is a X-ray diffraction instrument, perfect for thin film application, equipped with four motorized axes stage, having as typical applications: XR Reflectometry, Rocking measurements, q/2q measurements and structural phase identification