Consulting on Optical Characterization

Service description

Various optical measurement techniques are available in a wide range of wavelengths from ultraviolet to near infrared for solid materials, both massive and thin-film, including multilayer systems. The available techniques allow us to make measurements of transmission, reflectance, and scattering with integrating sphere, as well as spectroscopic ellipsometry with variable angle. We have software for the independent analysis of the measurements or combining several of them. Our experts can thus determine the values of the optical constants of the materials, and associated properties (for example in the case of semiconductors the bandgap), and finally in the case of thin films once known their properties can determine their thickness with nanometric precision. Finally, these techniques combined with other structural and compositional characterization techniques allow to determine in detail compositional and surface properties, such as the determination of the formation of oxide surface layers. Finally with the available software it is also possible to assist in the design of coatings with specific optical responses.