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New illumination device suitable for optical spectroscopy characterization of optical and/or optoelectronic materials and devices
Manufacturing procedure for suspended gauges for high-precision and non-invasive optical calibration
High-sensitivity standardized system for triboelectric characterization of materials. It detects minimal structural variations, and its easy…
Modified and optimized procedure for measuring thermal conductivity using LFA (Laser Flash Analysis). Includes software that enables precise…