Single-events effects (SEE) tests by pulsed-laser technique

Benefit description

Electronic devices in space, defense, and medical systems are exposed to various types of radiation, including high-energy photons and high-energy particles (electrons, protons, neutrons, and ions). The radiation may produce effects that may be manifested as long-term parameter degradation (Total Ionization Dose or TID effects) or as transient changes in the state of the circuits (transient effects). While the total-dose hardness of integrated circuit manufacturing process has generally improved in recent years, primarily because of reductions in gate oxide thicknesses and increases in doping densities, reduced device dimensions have increased sensitivity to transient radiation effects. This service provides the possibility of study Single-Events Effects (SEE) induced by the impact of a high-energy particle in a semiconductor device or circuit using pulsed laser method, which is a powerful and low-cost tool to obtain information about the spatial and temporal dependence of ICs radiation sensitivity. The equipment of the service consists of a very-compact femtosecond PULSBOX PICO-RAD 1064_50 Laser, from PULSCAN, which uses single-photon technique with 1064nm wavelength and a MSO9404A mixed-signal oscilloscope for the output signal acquisition.