Área de investigación Ciencia y Tecnologías Físicas Instituto INSTITUTO DE MICROELECTRONICA DE SEVILLA Importe 62.100,00 € STATISTICAL APPROACH TO DEFECT SIMULATION IN COMPLEX ANALOG AND MIXED-SIGNAL CIRCUITS: APPLICATION TO RADIATION-INDUCED SINGLE-EVENT TRANSIENTS Integrantes: GILDAS LEGER EDUARDO JOSE PERALIAS MACIAS