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  • MODOFICATION OF ATOMIC FORCE MICROSCOPY TIPS BY MEANS OF DEPOSITING NANOPARTICLES WITH AN ION CLUSTER SOURCE
Instituto
INSTITUTO DE CIENCIA DE MATERIALES DE MADRID

MODOFICATION OF ATOMIC FORCE MICROSCOPY TIPS BY MEANS OF DEPOSITING NANOPARTICLES WITH AN ION CLUSTER SOURCE

Investigadores

YVES HUTTEL
LIDIA MARTINEZ ORELLANA