FABRICATION OF TIPS FOR SCANNING PROBE MICROSCOPY WITH ENHANCED RESOLUTION

CSIC has developed tips for scanning probe microscopy (SPM) where an isolated nanoparticle is placed at the apex of the tip. The method allows to tailor the shape, size and composition of the nanoparticle improving the measuring capabilities of the tips. These novel tips are suitable for techniques that combine imaging, such as SPM and spectroscopy like tip-enhanced Raman spectroscopy (TERS). 

Industrial partners manufacturers of laboratory equipment are being sought to collaborate through a patent license agreement.