Áreas de investigación: Ciencia y Tecnología de Materiales

Grupo: Microscopía, Microanálisis e Imagen

Subgroup: Transmisión

Structural Characterization: Tranmision Electron Microscopy (TEM)

Information relating to the units that offer the selected service
Support unit	Support unit Information	Selected service	Other services
Microscopia electronica ICMAB - Cerdanyola del Vallès
Laboratorio de Nanoscopías y Espectroscopías LANE ICMS - Sevilla
LABORATORIO DE MICROSCOPIA ELECTRONICA CENIM - Madrid
Microscopía Electrónica de Transmisión CICCARTUJA - Sevilla
TEM-BIOPHYM IEM - Madrid

Service description

Observation and study of samples in an analytical transmission electron microscope (TEM) Jeol JEM 2010: 200 kV, resolution 0.19 nm, Cs 0.5 mm, double tilt + - 45. Equipped with microanalysis system X-rays scattering energy with XMax80T detector Oxford: SDD 80 mm2, resolution 129 eV Mn Ka; CCD camera Gatan Orious 600. The observation of samples consisting in visualizating images of bright field and dark field electron diffraction patterns selected area, microdiffraction and microanalysis. The studies conducted related to the observation grain orientation determination of crystal structures of the phases present and chemical composition, defect analysis, etc.

Options and prices chart
Options	Unit	Public Sector	Other customers
General	euro / hora	91.01 €	114.07 €

Service description

Observation and study of samples in an analytical transmission electron microscope (TEM) Jeol JEM 2010: 200 kV, resolution 0.19 nm, Cs 0.5 mm, double tilt + - 45. Equipped with microanalysis system X-rays scattering energy with XMax80T detector Oxford: SDD 80 mm2, resolution 129 eV Mn Ka; CCD camera Gatan Orious 600. The observation of samples consisting in visualizating images of bright field and dark field electron diffraction patterns selected area, microdiffraction and microanalysis. The studies conducted related to the observation grain orientation determination of crystal structures of the phases present and chemical composition, defect analysis, etc.

Options and prices chart
Options	Unit	Public Sector	Other customers
General	hora uso microscopio	121.12 €	132.65 €

Service description

Observation and study of samples in an analytical transmission electron microscope (TEM) Jeol JEM 2010: 200 kV, resolution 0.19 nm, Cs 0.5 mm, double tilt + - 45. Equipped with microanalysis system X-rays scattering energy with XMax80T detector Oxford: SDD 80 mm2, resolution 129 eV Mn Ka; CCD camera Gatan Orious 600. The observation of samples consisting in visualizating images of bright field and dark field electron diffraction patterns selected area, microdiffraction and microanalysis. The studies conducted related to the observation grain orientation determination of crystal structures of the phases present and chemical composition, defect analysis, etc.

Options and prices chart
Options	Unit	Public Sector	Other customers
Sesión de dos horas en TEM	€ / sesión	212.16 €	232.37 €

Service description

Observation and study of samples in an analytical transmission electron microscope (TEM) Jeol JEM 2010: 200 kV, resolution 0.19 nm, Cs 0.5 mm, double tilt + - 45. Equipped with microanalysis system X-rays scattering energy with XMax80T detector Oxford: SDD 80 mm2, resolution 129 eV Mn Ka; CCD camera Gatan Orious 600. The observation of samples consisting in visualizating images of bright field and dark field electron diffraction patterns selected area, microdiffraction and microanalysis. The studies conducted related to the observation grain orientation determination of crystal structures of the phases present and chemical composition, defect analysis, etc.

Options and prices chart
Options	Unit	Public Sector	Other customers
General	hora uso microscopio	88.06 €	96.45 €

Service description

Observation and study of samples in an analytical transmission electron microscope (TEM) Jeol JEM 2010: 200 kV, resolution 0.19 nm, Cs 0.5 mm, double tilt + - 45. Equipped with microanalysis system X-rays scattering energy with XMax80T detector Oxford: SDD 80 mm2, resolution 129 eV Mn Ka; CCD camera Gatan Orious 600. The observation of samples consisting in visualizating images of bright field and dark field electron diffraction patterns selected area, microdiffraction and microanalysis. The studies conducted related to the observation grain orientation determination of crystal structures of the phases present and chemical composition, defect analysis, etc.

Options and prices chart
Options	Unit	Public Sector	Other customers
Sesión de TEM	euro / sesión	120.03 €	131.46 €